@conference {Comisso2015,
	title = {Characterization of TiO2 thin films in the EUV and soft X-ray region},
	booktitle = {Proceedings of SPIE - The International Society for Optical Engineering},
	volume = {9510},
	year = {2015},
	note = {cited By 0},
	doi = {10.1117/12.2178142},
	url = {http://www.scopus.com/inward/record.url?eid=2-s2.0-84949024021&partnerID=40&md5=f5b48ae10935b8866e0231eb74391559},
	author = {Comisso, A. and Giglia, A. and Nardello, M. and Tessarolo, E. and Calvillo, L. and Sertsu, M.G. and Granozzi, G. and Gerlin, F. and Brigo, L. and Nicolosi, P.}
}
