@conference {Franta2016,
	title = {Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range},
	booktitle = {Proceedings of SPIE - The International Society for Optical Engineering},
	volume = {9890},
	year = {2016},
	note = {cited By 0},
	doi = {10.1117/12.2227580},
	url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-84983070218&partnerID=40&md5=0bc5b43409ef0fa04e1d4029ae7a51a0},
	author = {Franta, D. and Nečas, D. and Ohlídal, I. and Giglia, A.}
}
