@article {Lorenzi20181,
	title = {Phonon Scattering in Silicon by Multiple Morphological Defects: A Multiscale Analysis},
	journal = {Journal of Electronic Materials},
	year = {2018},
	note = {cited By 0; Article in Press},
	pages = {1-10},
	doi = {10.1007/s11664-018-6337-z},
	url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-85046821897&doi=10.1007%2fs11664-018-6337-z&partnerID=40&md5=8941488e410ae655cbf10eb755b92b42},
	author = {Lorenzi, B. and Dettori, R. and Dunham, M.T. and Melis, C. and Tonini, R. and Colombo, L. and Sood, A. and Goodson, K.E. and Narducci, D.}
}
