@article {Niu2013,
	title = {X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2-xO3 (x=0-2) films on Si (111)},
	journal = {Journal of Applied Physics},
	volume = {113},
	number = {4},
	year = {2013},
	month = {jan},
	pages = {043504},
	doi = {10.1063/1.4788982},
	author = {Niu, G. and Zoellner, M. H. and Zaumseil, P. and Pouliopoulos, A. and D'Acapito, F. and Schroeder, T. and Boscherini, F.}
}
