{\rtf1\ansi\deff0\deftab360

{\fonttbl
{\f0\fswiss\fcharset0 Arial}
{\f1\froman\fcharset0 Times New Roman}
{\f2\fswiss\fcharset0 Verdana}
{\f3\froman\fcharset2 Symbol}
}

{\colortbl;
\red0\green0\blue0;
}

{\info
{\author Biblio 7.x}{\operator }{\title Biblio RTF Export}}

\f1\fs24
\paperw11907\paperh16839
\pgncont\pgndec\pgnstarts1\pgnrestart
A.  Comisso, Giglia, A., Nardello, M., Tessarolo, E., Calvillo, L., Sertsu, M. G., Granozzi, G., Gerlin, F., Brigo, L., and Nicolosi, P., ?Characterization of TiO2 thin films in the EUV and soft X-ray region?, in Proceedings of SPIE - The International Society for Optical Engineering, 2015, vol. 9510.\par \par }