B.  Lorenzi, Dettori, R., Dunham, M. T., Melis, C., Tonini, R., Colombo, L., Sood, A., Goodson, K. E., and Narducci, D., ?Phonon Scattering in Silicon by Multiple Morphological Defects: A Multiscale Analysis?, Journal of Electronic Materials, vol. 47, pp. 5148-5157, 2018.