1.5 MeV proton irradiation effects on electrical and structural properties of TiO2/n-Si interface
| Title | 1.5 MeV proton irradiation effects on electrical and structural properties of TiO2/n-Si interface |
| Publication Type | Journal Article |
| Year of Publication | 2014 |
| Authors | Ishfaq, M, M. Khan, R, Bhopal, MF, Nasim, F, Ali, A, Bhatti, AS, Ahmed, I, Bhardwaj, S, Cepek, C |
| Journal | Journal of Applied Physics |
| Volume | 115 |
| Pagination | 174506 |
| Date Published | may |
| DOI | 10.1063/1.4874942 |
