Smaller and Faster: Infrared and Terahertz Spectral-Imaging at the Nanoscale with Synchrotron Radiation and Free Electron Laser Sources (SAFE)
ICTP, Trieste Italy, 1-2 December 2016
The combination of near-field microscopes with unconventional IR and THz sources offers unprecedented opportunities for material characterization, widening the perspectives in a multitude of fields of sciences by confining vibro-electronic information within few tens of nanometers. Electronic, plasmonic, magnetic, and structural dynamic phenomena occurring at the nanometer scale in heterostructured and phase separated materials can now be addressed by coupling powerful and ultrafast optical sources with near-field probes. The aim of SAFE is to present the most recent technological advancements and innovative applications achieved with state-of-the-art near-field microscopes. Potentialities of this technique in field of science ranging from biochemistry to material science, and encompassing time resolved spectroscopy will be presented.
More details can be found at the SAFE Website
The scientific committee
Giovanni Birarda (Elettra Sincrotrone Trieste, Italy)
Paola Di Pietro (Elettra Sincrotrone Trieste, Italy)
Stefano Lupi (IOM-CNR and Sapienza University of Rome, Italy)
Andrea Perucchi (Elettra Sincrotrone Trieste, Italy)
Lisa Vaccari (Elettra Sincrotrone Trieste, Italy)
