Advances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics

TitleAdvances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics
Publication TypeJournal Article
Year of Publication2018
AuthorsCocco, D, Idir, M, Morton, D, Raimondi, L, Zangrando, M
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85044968704&doi=10.1016%2fj.nima.2018.03.026&partnerID=40&md5=e7327c7faf5ddb0df4cd4bdd080f0639
DOI10.1016/j.nima.2018.03.026