Electronic properties of epitaxial cerium oxide films during controlled reduction and oxidation studied by resonant inelastic X-ray scattering

TitleElectronic properties of epitaxial cerium oxide films during controlled reduction and oxidation studied by resonant inelastic X-ray scattering
Publication TypeJournal Article
Year of Publication2016
AuthorsGasperi, G, Amidani, L, Benedetti, F, Boscherini, F, Glatzel, P, Valeri, S, Luches, P
JournalPhysical Chemistry Chemical Physics
Volume18
Pagination20511-20517
URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84979955076&partnerID=40&md5=88ed22680355123bd7b0a7903455816c
DOI10.1039/c6cp04407g