High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development

TitleHigh resolution beam profiling of X-ray free electron laser radiation by polymer imprint development
Publication TypeJournal Article
Year of Publication2017
AuthorsRösner, B, Döring, F, Ribic, PR, Gauthier, D, Principi, E, Masciovecchio, C, Zangrando, M, Vila-Comamala, J, De Ninno, G, David, C
JournalOptics Express
Volume25
Pagination30686-30695
URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85035775945&doi=10.1364%2fOE.25.030686&partnerID=40&md5=63e220766a1bb7d09b369bc2013ff265
DOI10.1364/OE.25.030686