Interfacial and bulk electronic properties of complex oxides and buried interfaces probed by HAXPES

TitleInterfacial and bulk electronic properties of complex oxides and buried interfaces probed by HAXPES
Publication TypeJournal Article
Year of Publication2013
AuthorsBorgatti, F, Offi, F, Torelli, P, Monaco, G, Panaccione, G
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume190
Pagination228–234
Date Publishedoct
DOI10.1016/j.elspec.2013.01.002