Grain size and stoichiometry control over RF-sputtered multiferroic BiFeO3 thin films on silicon substrates

TitleGrain size and stoichiometry control over RF-sputtered multiferroic BiFeO3 thin films on silicon substrates
Publication TypeJournal Article
Year of Publication2015
AuthorsDrera, G, Giampietri, A, Alessandri, I, Magnano, E, Bondino, F, Nappini, S
JournalThin Solid Films
Volume589
Pagination551-555
URLhttp://www.scopus.com/inward/record.url?eid=2-s2.0-84940063586&partnerID=40&md5=14626ca92e987479725add2dbaabe501
DOI10.1016/j.tsf.2015.06.030