Optical and electrical characteristics of 17 keV X-rays exposed TiO2 films and Ag/TiO2/p-Si MOS device
| Title | Optical and electrical characteristics of 17 keV X-rays exposed TiO2 films and Ag/TiO2/p-Si MOS device |
| Publication Type | Journal Article |
| Year of Publication | 2017 |
| Authors | Ishfaq, M, Khan, MR, Ali, A, Bhardwaj, S, Cepek, C, Bhatti, AS |
| Journal | Materials Science in Semiconductor Processing |
| Volume | 63 |
| Pagination | 107-114 |
| URL | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85013026883&doi=10.1016%2fj.mssp.2017.02.009&partnerID=40&md5=5b4887e34ab9a678bec7f1518c0ff006 |
| DOI | 10.1016/j.mssp.2017.02.009 |
