SEI Growth and Depth Profiling on ZFO Electrodes by Soft X-Ray Absorption Spectroscopy

TitleSEI Growth and Depth Profiling on ZFO Electrodes by Soft X-Ray Absorption Spectroscopy
Publication TypeJournal Article
Year of Publication2015
AuthorsDi Cicco, A, Giglia, A, Gunnella, R, Koch, SL, Mueller, F, Nobili, F, Pasqualini, M, Passerini, S, Tossici, R, Witkowska, A
JournalAdvanced Energy Materials
Volume5
URLhttp://www.scopus.com/inward/record.url?eid=2-s2.0-84942843390&partnerID=40&md5=91365731ce5dd31305efba95669bc00e
DOI10.1002/aenm.201500642