A tandem time-of-flight spectrometer for negative-ion/positive-ion coincidence measurements with soft x-ray excitation

TitleA tandem time-of-flight spectrometer for negative-ion/positive-ion coincidence measurements with soft x-ray excitation
Publication TypeJournal Article
Year of Publication2016
AuthorsStråhlman, C, Sankari, R, Kivimäki, A, Richter, R, Coreno, M, Nyholm, R
JournalReview of Scientific Instruments
Volume87
URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84956603966&partnerID=40&md5=38896efef8f463c17e96ffa44100279a
DOI10.1063/1.4940425