TEM for Characterization of Semiconductor Nanomaterials
| Title | TEM for Characterization of Semiconductor Nanomaterials |
| Publication Type | Book Chapter |
| Year of Publication | 2014 |
| Authors | Carlino, E |
| Editor | Kumar, CSSR |
| Book Title | Transmission Electron Microscopy Characterization of Nanomaterials |
| Pagination | 89-138– |
| Publisher | Springer Berlin Heidelberg |
| ISBN | 978-3-642-38933-7 |
| DOI | 10.1007/978-3-642-38934-4_3 |
