Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range
| Title | Optical characterization of SiO2 thin films using universal dispersion model over wide spectral range |
| Publication Type | Conference Paper |
| Year of Publication | 2016 |
| Authors | Franta, D, Nečas, D, Ohlídal, I, Giglia, A |
| Conference Name | Proceedings of SPIE - The International Society for Optical Engineering |
| URL | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84983070218&partnerID=40&md5=0bc5b43409ef0fa04e1d4029ae7a51a0 |
| DOI | 10.1117/12.2227580 |
