Phonon Scattering in Silicon by Multiple Morphological Defects: A Multiscale Analysis
| Title | Phonon Scattering in Silicon by Multiple Morphological Defects: A Multiscale Analysis |
| Publication Type | Journal Article |
| Year of Publication | 2018 |
| Authors | Lorenzi, B, Dettori, R, Dunham, MT, Melis, C, Tonini, R, Colombo, L, Sood, A, Goodson, KE, Narducci, D |
| Journal | Journal of Electronic Materials |
| Pagination | 1-10 |
| URL | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85046821897&doi=10.1007%2fs11664-018-6337-z&partnerID=40&md5=8941488e410ae655cbf10eb755b92b42 |
| DOI | 10.1007/s11664-018-6337-z |
