X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2-xO3 (x=0-2) films on Si (111)

TitleX-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2-xO3 (x=0-2) films on Si (111)
Publication TypeJournal Article
Year of Publication2013
AuthorsNiu, G, Zoellner, MH, Zaumseil, P, Pouliopoulos, A, D'Acapito, F, Schroeder, T, Boscherini, F
JournalJournal of Applied Physics
Volume113
Pagination043504
Date Publishedjan
DOI10.1063/1.4788982