X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2-xO3 (x=0-2) films on Si (111)
Title | X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2-xO3 (x=0-2) films on Si (111) |
Publication Type | Journal Article |
Year of Publication | 2013 |
Authors | Niu, G, Zoellner, MH, Zaumseil, P, Pouliopoulos, A, D'Acapito, F, Schroeder, T, Boscherini, F |
Journal | Journal of Applied Physics |
Volume | 113 |
Pagination | 043504 |
Date Published | jan |
DOI | 10.1063/1.4788982 |