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2013
G. Niu, Zoellner, M. H., Zaumseil, P., Pouliopoulos, A., D'Acapito, F., Schroeder, T., and Boscherini, F., “X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2-xO3 (x=0-2) films on Si (111)”, Journal of Applied Physics, vol. 113, p. 043504, 2013.

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